The switcheroo tests only really serve to check functional
correctness. Checking for stat differences in them just increases the
size of reference diffs.
Signed-off-by: Andreas Sandberg <andreas.sandberg@arm.com>
Switcheroo and checkpoint tests should generally be considered to be
successful if they run to completion. Remove all reference output
files from the switcheroo and checkopint tests to make them purely
functional.
Change-Id: I70b47853bd662b7a33716d9e0d2154b16077f9dc
Signed-off-by: Andreas Sandberg <andreas.sandberg@arm.com>
Reviewed-by: Curtis Dunham <curtis.dunham@arm.com>
Update stats to match current behaviour. As a result of the earlier
conflict check we are seeing a few prefetch requests being ignored
before being sent as upward snoops.
The fs/80.solaris-boot/sparc/solaris/t1000-simple-atomic test was
broken for so long that, now that it's working again, the stats
output is out of date. This changeset updates the outputs, on
the assumption that the stats changes are all valid differences
due to other changes made while it was broken.
A couple of the long regressions have been showing as CHANGED
since 11244:a2af58a06c4e despite the updates in 11245:1c5102c0a7a9.
The x86 regression looks like it was just missed, but it's not clear
why the ARM one is giving different results (perhaps a non-determinism
between zizzer and wherever the updated results were run?).
The Minor draining fixes affect perturb the timing slightly since it
affects how the simulator is drained. Update reference statistics to
reflect this expected change.
The pc-switcheroo test cases has slightly different timing after
decoupling draining from the SimObject hierarchy. This is expected
since objects aren't drained in the exact same order as before.
This update includes the changes to whole-line writes, the refinement
of Read to ReadClean and ReadShared, the introduction of CleanEvict
for snoop-filter tracking, and updates to the DRAM command scheduler
for bank-group-aware scheduling.
Needless to say, almost every regression is affected.
